Hong-Dar Lin, Chih-Hao Chien. Automated Detection of Color Non-Uniformity Defects in TFT-LCD. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2006, part of the IEEE World Congress on Computational Intelligence, WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006. pages 1405-1412, IEEE, 2006. [doi]
@inproceedings{LinC06:24,
title = {Automated Detection of Color Non-Uniformity Defects in TFT-LCD},
author = {Hong-Dar Lin and Chih-Hao Chien},
year = {2006},
doi = {10.1109/IJCNN.2006.246858},
url = {http://dx.doi.org/10.1109/IJCNN.2006.246858},
researchr = {https://researchr.org/publication/LinC06%3A24},
cites = {0},
citedby = {0},
pages = {1405-1412},
booktitle = {Proceedings of the International Joint Conference on Neural Networks, IJCNN 2006, part of the IEEE World Congress on Computational Intelligence, WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006},
publisher = {IEEE},
}