Kuo-Sui Lin. New Vague Set Based Similarity Measure for Pattern Recognition. In Masahide Nakamura, Hiroaki Hirata, Takayuki Ito, Takanobu Otsuka, Shun Okuhara, editors, 20th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2019, Toyama, Japan, July 8-11, 2019. pages 15-21, IEEE, 2019. [doi]
@inproceedings{Lin19-60,
title = {New Vague Set Based Similarity Measure for Pattern Recognition},
author = {Kuo-Sui Lin},
year = {2019},
doi = {10.1109/SNPD.2019.8935733},
url = {https://doi.org/10.1109/SNPD.2019.8935733},
researchr = {https://researchr.org/publication/Lin19-60},
cites = {0},
citedby = {0},
pages = {15-21},
booktitle = {20th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2019, Toyama, Japan, July 8-11, 2019},
editor = {Masahide Nakamura and Hiroaki Hirata and Takayuki Ito and Takanobu Otsuka and Shun Okuhara},
publisher = {IEEE},
isbn = {978-1-7281-1651-8},
}