Kuo-Sui Lin. New Vague Set Based Similarity Measure for Pattern Recognition. In Masahide Nakamura, Hiroaki Hirata, Takayuki Ito, Takanobu Otsuka, Shun Okuhara, editors, 20th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2019, Toyama, Japan, July 8-11, 2019. pages 15-21, IEEE, 2019. [doi]
Abstract is missing.