Fang Lin, Ali Ahmadi, Kannan Sekar, Yan Pan, Ke Huang. IC layout weak point effectiveness evaluation based on statistical methods. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
@inproceedings{LinASPH18,
title = {IC layout weak point effectiveness evaluation based on statistical methods},
author = {Fang Lin and Ali Ahmadi and Kannan Sekar and Yan Pan and Ke Huang},
year = {2018},
doi = {10.1109/VTS.2018.8368655},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2018.8368655},
researchr = {https://researchr.org/publication/LinASPH18},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3774-6},
}