A compact SCR structure with reduced trigger voltage and parasitic capacitance for high-speed I/O ESD protection - researchr publication authors

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Longhua Lin, Shupeng Chen, Ruibo Chen, Zhengwei Zhang, Hongxia Liu, Feibo Du, Zhiwei Liu. A compact SCR structure with reduced trigger voltage and parasitic capacitance for high-speed I/O ESD protection. Microelectronics Journal, 168:107003, 2026. [doi]

This author has not been identified. Look up 'Longhua Lin' in GoogleThis author has not been identified. Look up 'Shupeng Chen' in GoogleThis author has not been identified. Look up 'Ruibo Chen' in GoogleThis author has not been identified. Look up 'Zhengwei Zhang' in GoogleThis author has not been identified. Look up 'Hongxia Liu' in GoogleThis author has not been identified. Look up 'Feibo Du' in GoogleThis author has not been identified. Look up 'Zhiwei Liu' in Google

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