Chun-Yu Lin, Li-Wei Chu, Ming-Dou Ker. Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process. Microelectronics Reliability, 51(8):1315-1324, 2011. [doi]
@article{LinCK11,
title = {Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process},
author = {Chun-Yu Lin and Li-Wei Chu and Ming-Dou Ker},
year = {2011},
doi = {10.1016/j.microrel.2011.03.016},
url = {http://dx.doi.org/10.1016/j.microrel.2011.03.016},
tags = {design},
researchr = {https://researchr.org/publication/LinCK11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {8},
pages = {1315-1324},
}