Yu-Cheng Lin, Toly Chen, Kun-Tai Li. Evaluating and Enhancing the Long-Term Competitiveness of a Semiconductor Product. In Been-Chian Chien, Tzung-Pei Hong, Shyi-Ming Chen, Moonis Ali, editors, Next-Generation Applied Intelligence, 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings. Volume 5579 of Lecture Notes in Computer Science, pages 242-251, Springer, 2009. [doi]
@inproceedings{LinCL09,
title = {Evaluating and Enhancing the Long-Term Competitiveness of a Semiconductor Product},
author = {Yu-Cheng Lin and Toly Chen and Kun-Tai Li},
year = {2009},
doi = {10.1007/978-3-642-02568-6_25},
url = {http://dx.doi.org/10.1007/978-3-642-02568-6_25},
researchr = {https://researchr.org/publication/LinCL09},
cites = {0},
citedby = {0},
pages = {242-251},
booktitle = {Next-Generation Applied Intelligence, 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings},
editor = {Been-Chian Chien and Tzung-Pei Hong and Shyi-Ming Chen and Moonis Ali},
volume = {5579},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-02567-9},
}