Yu-Cheng Lin, Toly Chen, Kun-Tai Li. Evaluating and Enhancing the Long-Term Competitiveness of a Semiconductor Product. In Been-Chian Chien, Tzung-Pei Hong, Shyi-Ming Chen, Moonis Ali, editors, Next-Generation Applied Intelligence, 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings. Volume 5579 of Lecture Notes in Computer Science, pages 242-251, Springer, 2009. [doi]
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