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A Test Method for Finding Boundary Currents of 1T1R Memristor Memories

Tzu-Ying Lin, Yong-Xiao Chen, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. A Test Method for Finding Boundary Currents of 1T1R Memristor Memories. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 281-286, IEEE Computer Society, 2016. [doi]

Authors

Tzu-Ying Lin

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Yong-Xiao Chen

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Jin-Fu Li

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Chih-Yen Lo

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Ding-Ming Kwai

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Yung-Fa Chou

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