A Test Method for Finding Boundary Currents of 1T1R Memristor Memories

Tzu-Ying Lin, Yong-Xiao Chen, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. A Test Method for Finding Boundary Currents of 1T1R Memristor Memories. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 281-286, IEEE Computer Society, 2016. [doi]

Abstract

Abstract is missing.