Yuzhen Lin, Han Chen, Bin Li, JunQiang Wu. Towards Generalizable DEEPFAKE Face Forgery Detection with Semi-Supervised Learning and Knowledge Distillation. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 576-580, IEEE, 2022. [doi]
Abstract is missing.