A novel fuzzy matching model for lithography hotspot detection - researchr publication authors

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Sheng-Yuan Lin, Jing-Yi Chen, Jin-Cheng Li, Wan-yu Wen, Shih-Chieh Chang. A novel fuzzy matching model for lithography hotspot detection. In The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013. pages 68, ACM, 2013. [doi]

This author has not been identified. Look up 'Sheng-Yuan Lin' in GoogleThis author has not been identified. Look up 'Jing-Yi Chen' in GoogleThis author has not been identified. Look up 'Jin-Cheng Li' in GoogleThis author has not been identified. Look up 'Wan-yu Wen' in GoogleThis author has not been identified. Look up 'Shih-Chieh Chang' in Google

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