Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process - researchr publication authors

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Tong Lin, Kwen-Siong Chong, Wei Shu, Ne Kyaw Zwa Lwin, Jize Jiang, Joseph S. Chang. Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 966-969, IEEE, 2016. [doi]

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