Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen. Analysis of narrow gap induced additional micro-ring loss. In 21st Annual Wireless and Optical Communications Conference, WOCC 2012, Kaohsiung, Taiwan, April 19-21, 2012. pages 191-192, IEEE, 2012. [doi]
@inproceedings{LinCYC12,
title = {Analysis of narrow gap induced additional micro-ring loss},
author = {Kaung-Cheng Lin and Wei-Lun Chang and Ruei Hao You and Yung-Jui Chen},
year = {2012},
doi = {10.1109/WOCC.2012.6198183},
url = {http://dx.doi.org/10.1109/WOCC.2012.6198183},
researchr = {https://researchr.org/publication/LinCYC12},
cites = {0},
citedby = {0},
pages = {191-192},
booktitle = {21st Annual Wireless and Optical Communications Conference, WOCC 2012, Kaohsiung, Taiwan, April 19-21, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0940-0},
}