Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen. Analysis of narrow gap induced additional micro-ring loss. In 21st Annual Wireless and Optical Communications Conference, WOCC 2012, Kaohsiung, Taiwan, April 19-21, 2012. pages 191-192, IEEE, 2012. [doi]
Abstract is missing.