A New Test Data Compression Scheme for Multi-scan Designs - researchr publication authors

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Teng Lin, Jianhua Feng, Yangyuan Wang. A New Test Data Compression Scheme for Multi-scan Designs. In 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil. pages 179-185, IEEE Computer Society, 2007. [doi]

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