Teng Lin, Jianhua Feng, Yangyuan Wang. A New Test Data Compression Scheme for Multi-scan Designs. In 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil. pages 179-185, IEEE Computer Society, 2007. [doi]
@inproceedings{LinFW07,
title = {A New Test Data Compression Scheme for Multi-scan Designs},
author = {Teng Lin and Jianhua Feng and Yangyuan Wang},
year = {2007},
doi = {10.1109/ISVLSI.2007.10},
url = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2007.10},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/LinFW07},
cites = {0},
citedby = {0},
pages = {179-185},
booktitle = {2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil},
publisher = {IEEE Computer Society},
}