Shih-Yen Lin, Ruey-Shiang Guh, Yeou-Ren Shiue. Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach. Computers & Industrial Engineering, 61(4):1123-1134, 2011. [doi]
@article{LinGS11-0,
title = {Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach},
author = {Shih-Yen Lin and Ruey-Shiang Guh and Yeou-Ren Shiue},
year = {2011},
doi = {10.1016/j.cie.2011.06.025},
url = {http://dx.doi.org/10.1016/j.cie.2011.06.025},
researchr = {https://researchr.org/publication/LinGS11-0},
cites = {0},
citedby = {0},
journal = {Computers & Industrial Engineering},
volume = {61},
number = {4},
pages = {1123-1134},
}