Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach - researchr publication

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Shih-Yen Lin, Ruey-Shiang Guh, Yeou-Ren Shiue. Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach. Computers & Industrial Engineering, 61(4):1123-1134, 2011. [doi]

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