Chao Lin, Jingsong He. A Novel Negative-Correlation Redundancy Evolutionary Framework Based on Stochastic Ranking for Fault-Tolerant Design of Analog Circuit. In Ying Tan, Yuhui Shi, Hongwei Mo, editors, Advances in Swarm Intelligence, 4th International Conference, ICSI 2013, Harbin, China, June 12-15, 2013, Proceedings, Part I. Volume 7928 of Lecture Notes in Computer Science, pages 556-563, Springer, 2013. [doi]
Abstract is missing.