Da-Shin Lin, Hao-Ping Hong. A 0.5V BJT-based CMOS thermal sensor in 10-nm FinFET technology. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2017, Seoul, Korea (South), November 6-8, 2017. pages 41-44, IEEE, 2017. [doi]
@inproceedings{LinH17-7,
title = {A 0.5V BJT-based CMOS thermal sensor in 10-nm FinFET technology},
author = {Da-Shin Lin and Hao-Ping Hong},
year = {2017},
doi = {10.1109/ASSCC.2017.8240211},
url = {https://doi.org/10.1109/ASSCC.2017.8240211},
researchr = {https://researchr.org/publication/LinH17-7},
cites = {0},
citedby = {0},
pages = {41-44},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2017, Seoul, Korea (South), November 6-8, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3178-2},
}