Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT

Long-Yi Lin, Hao-Chiao Hong. Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT. IEEE Trans. Circuits Syst. I Regul. Pap., 69(1):114-127, 2022. [doi]

Abstract

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