Mei-Chun Lin, Mu-Hsuan Huang, Dar-Zen Chen. Classifying Patents by Tracing the Chronology of Patent Citation Increments. In 2018 IEEE International Conference on Engineering, Technology and Innovation (ICE/ITMC), Stuttgart, Germany, June 17-20, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.