A mutual characterization based SAR ADC self-testing technique

H.-J. Lin, X.-L. Huang, J.-L. Huang. A mutual characterization based SAR ADC self-testing technique. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.