Sample Tilt Control for Atomic Force Microscopes with Multiple Parallel Active Cantilevers - researchr publication authors

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Tingyi Lin, Yizhou Hao, Wenyue Li, Joshua Sung, Fangzhou Xia. Sample Tilt Control for Atomic Force Microscopes with Multiple Parallel Active Cantilevers. In American Control Conference, ACC 2026, New Orleans, LA, USA, May 26-29, 2026. pages 1676-1682, IEEE, 2026. [doi]

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