Tingyi Lin, Yizhou Hao, Wenyue Li, Joshua Sung, Fangzhou Xia. Sample Tilt Control for Atomic Force Microscopes with Multiple Parallel Active Cantilevers. In American Control Conference, ACC 2026, New Orleans, LA, USA, May 26-29, 2026. pages 1676-1682, IEEE, 2026. [doi]
@inproceedings{LinHLSX26,
title = {Sample Tilt Control for Atomic Force Microscopes with Multiple Parallel Active Cantilevers},
author = {Tingyi Lin and Yizhou Hao and Wenyue Li and Joshua Sung and Fangzhou Xia},
year = {2026},
url = {https://ieeexplore.ieee.org/document/11615797},
researchr = {https://researchr.org/publication/LinHLSX26},
cites = {0},
citedby = {0},
pages = {1676-1682},
booktitle = {American Control Conference, ACC 2026, New Orleans, LA, USA, May 26-29, 2026},
publisher = {IEEE},
isbn = {979-8-3315-9381-0},
}