Automatic inspection of backlight modules by using support vector regressions

Wu-Ja Lin, Sin-Sin Jhuo. Automatic inspection of backlight modules by using support vector regressions. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013. pages 1834-1837, IEEE, 2013. [doi]

Authors

Wu-Ja Lin

This author has not been identified. Look up 'Wu-Ja Lin' in Google

Sin-Sin Jhuo

This author has not been identified. Look up 'Sin-Sin Jhuo' in Google