Wu-Ja Lin, Sin-Sin Jhuo. Automatic inspection of backlight modules by using support vector regressions. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013. pages 1834-1837, IEEE, 2013. [doi]
@inproceedings{LinJ13-4,
title = {Automatic inspection of backlight modules by using support vector regressions},
author = {Wu-Ja Lin and Sin-Sin Jhuo},
year = {2013},
doi = {10.1109/I2MTC.2013.6555731},
url = {https://doi.org/10.1109/I2MTC.2013.6555731},
researchr = {https://researchr.org/publication/LinJ13-4},
cites = {0},
citedby = {0},
pages = {1834-1837},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4621-4},
}