Exploiting Polygon Metadata to Understand Raster Maps - Accurate Polygonal Feature Extraction

Fandel Lin, Craig A. Knoblock, Basel Shbita, Binh Vu, Zekun Li 0007, Yao-Yi Chiang. Exploiting Polygon Metadata to Understand Raster Maps - Accurate Polygonal Feature Extraction. In Matthias Renz, Mario A. Nascimento, editors, Proceedings of the 31st ACM International Conference on Advances in Geographic Information Systems, SIGSPATIAL 2023, Hamburg, Germany, November 13-16, 2023. ACM, 2023. [doi]

Abstract

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