Yunkun Lin, Mingye Li, Sandeep Gupta 0001. Predictive Testing for Aging in SRAMs and Mitigation. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 293-302, IEEE, 2024. [doi]
@inproceedings{LinL024,
title = {Predictive Testing for Aging in SRAMs and Mitigation},
author = {Yunkun Lin and Mingye Li and Sandeep Gupta 0001},
year = {2024},
doi = {10.1109/ITC51657.2024.00050},
url = {https://doi.org/10.1109/ITC51657.2024.00050},
researchr = {https://researchr.org/publication/LinL024},
cites = {0},
citedby = {0},
pages = {293-302},
booktitle = {IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024},
publisher = {IEEE},
isbn = {979-8-3315-2013-7},
}