Honghuang Lin, Peng Li. Relevance vector and feature machine for statistical analog circuit characterization and built-in self-test optimization. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 11, ACM, 2016. [doi]
@inproceedings{LinL16-16,
title = {Relevance vector and feature machine for statistical analog circuit characterization and built-in self-test optimization},
author = {Honghuang Lin and Peng Li},
year = {2016},
doi = {10.1145/2897937.2898081},
url = {http://doi.acm.org/10.1145/2897937.2898081},
researchr = {https://researchr.org/publication/LinL16-16},
cites = {0},
citedby = {0},
pages = {11},
booktitle = {Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016},
publisher = {ACM},
isbn = {978-1-4503-4236-0},
}