Chun-Wei Lin, Sheng-Feng Lin, Yu-Wei Chen. Linearity enhancement technique of ramp generator for ADC testing. IEICE Electronic Express, 10(9):20130179, 2013. [doi]
@article{LinLC13-8,
title = {Linearity enhancement technique of ramp generator for ADC testing},
author = {Chun-Wei Lin and Sheng-Feng Lin and Yu-Wei Chen},
year = {2013},
doi = {10.1587/elex.10.20130179},
url = {http://dx.doi.org/10.1587/elex.10.20130179},
researchr = {https://researchr.org/publication/LinLC13-8},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {10},
number = {9},
pages = {20130179},
}