Shih-Ping Lin, Chung-Len Lee, Jwu E. Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu. A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
@inproceedings{LinLCCLW06,
title = {A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs},
author = {Shih-Ping Lin and Chung-Len Lee and Jwu E. Chen and Ji-Jan Chen and Kun-Lun Luo and Wen Ching Wu},
year = {2006},
doi = {10.1109/TEST.2006.297663},
url = {http://dx.doi.org/10.1109/TEST.2006.297663},
researchr = {https://researchr.org/publication/LinLCCLW06},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006},
editor = {Scott Davidson and Anne Gattiker},
publisher = {IEEE},
isbn = {1-4244-0292-1},
}