MAD: A Multiscale and Patch-Based Zero-Shot Framework for Industrial Anomaly Detection

Leping Lin, Ritian Lu, Liqin Gong, Ning Ouyang. MAD: A Multiscale and Patch-Based Zero-Shot Framework for Industrial Anomaly Detection. Signal, Image and Video Processing, 20(8):461, July 2026. [doi]

Authors

Leping Lin

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Ritian Lu

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Liqin Gong

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Ning Ouyang

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