MAD: A Multiscale and Patch-Based Zero-Shot Framework for Industrial Anomaly Detection

Leping Lin, Ritian Lu, Liqin Gong, Ning Ouyang. MAD: A Multiscale and Patch-Based Zero-Shot Framework for Industrial Anomaly Detection. Signal, Image and Video Processing, 20(8):461, July 2026. [doi]

Abstract

Abstract is missing.