Ching-Yuan Lin, Chung-Hung Lin, Chien-Hung Ho, Wei-Wu Liao, Shu-Yueh Lee, Ming-Chou Ho, Shih-Chen Wang, Shih-Chan Huang, Yuan-Tai Lin, Charles Ching-Hsiang Hsu. Embedded OTP fuse in CMOS logic process. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 13-15, IEEE Computer Society, 2005. [doi]
@inproceedings{LinLHLLHWHLH05,
title = {Embedded OTP fuse in CMOS logic process},
author = {Ching-Yuan Lin and Chung-Hung Lin and Chien-Hung Ho and Wei-Wu Liao and Shu-Yueh Lee and Ming-Chou Ho and Shih-Chen Wang and Shih-Chan Huang and Yuan-Tai Lin and Charles Ching-Hsiang Hsu},
year = {2005},
doi = {10.1109/MTDT.2005.22},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2005.22},
researchr = {https://researchr.org/publication/LinLHLLHWHLH05},
cites = {0},
citedby = {0},
pages = {13-15},
booktitle = {13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2313-7},
}