Shu-Yung Lin, Ssu-Yu Lin, Sheng-Hsi Hung, Tz-Wun Wang, Ching-Ho Li, Chang-Lin Go, Shao-Chang Huang, Ke-Horng Chen, Kuo-Lin Zheng, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai. A GaN Gate Driver with On-chip Adaptive On-time Controller and Negative Current Slope Detector. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 306-307, IEEE, 2023. [doi]
@inproceedings{LinLHWLGHCZLLT23,
title = {A GaN Gate Driver with On-chip Adaptive On-time Controller and Negative Current Slope Detector},
author = {Shu-Yung Lin and Ssu-Yu Lin and Sheng-Hsi Hung and Tz-Wun Wang and Ching-Ho Li and Chang-Lin Go and Shao-Chang Huang and Ke-Horng Chen and Kuo-Lin Zheng and Ying-Hsi Lin and Shian-Ru Lin and Tsung-Yen Tsai},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067355},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067355},
researchr = {https://researchr.org/publication/LinLHWLGHCZLLT23},
cites = {0},
citedby = {0},
pages = {306-307},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}