Dongyun Lin, Yiqun Li, Shitala Prasad, Tin Lay Nwe, Sheng Dong, Zaw Min Oo. CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement for Defect Segmentation. In IEEE International Conference on Image Processing, ICIP 2020, Abu Dhabi, United Arab Emirates, October 25-28, 2020. pages 2131-2135, IEEE, 2020. [doi]
Abstract is missing.