Fault diagnosis for linear analog circuits

Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen. Fault diagnosis for linear analog circuits. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 25-30, IEEE Computer Society, 2000. [doi]

Authors

Jun-Weir Lin

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Chung-Len Lee

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Chauchin Su

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Jwu E. Chen

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