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Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen. Fault diagnosis for linear analog circuits. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 25-30, IEEE Computer Society, 2000. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Fault Diagnosis for Linear Analog CircuitsJun-Weir Lin, Chung-Len Lee, Chau-chin Su, Jwu E. Chen. et, 17(6):483-494, 2001. [doi] Intelligent fault diagnosis for analog circuitsRui Chen, Zhenchao Zhou. emeit 2011: 1263-1266 [doi]
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