A BIST methodology for at-speed testing of data communications transceivers

S. L. Lin, S. Mourad, S. Krishnan. A BIST methodology for at-speed testing of data communications transceivers. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 216-221, IEEE Computer Society, 2000. [doi]

Authors

S. L. Lin

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S. Mourad

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S. Krishnan

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