S. L. Lin, S. Mourad, S. Krishnan. A BIST methodology for at-speed testing of data communications transceivers. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 216-221, IEEE Computer Society, 2000. [doi]
@inproceedings{LinMK00,
title = {A BIST methodology for at-speed testing of data communications transceivers},
author = {S. L. Lin and S. Mourad and S. Krishnan},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870216abs.htm},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/LinMK00},
cites = {0},
citedby = {0},
pages = {216-221},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}