Physically-Aware N-Detect Test

Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar. Physically-Aware N-Detect Test. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(2):308-321, 2012. [doi]

Authors

Yen-Tzu Lin

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Osei Poku

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R. D. (Shawn) Blanton

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Phil Nigh

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Peter Lloyd

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Vikram Iyengar

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