Test Power Reduction by Blocking Scan Cell Outputs

Xijiang Lin, Janusz Rajski. Test Power Reduction by Blocking Scan Cell Outputs. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 329-336, IEEE Computer Society, 2008. [doi]

Authors

Xijiang Lin

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Janusz Rajski

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