Ming-Guan Lin, Kenneth Rose. Applying Test Theory to VLSI Testing. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 580-586, IEEE Computer Society, 1982.
@inproceedings{LinR82,
title = {Applying Test Theory to VLSI Testing},
author = {Ming-Guan Lin and Kenneth Rose},
year = {1982},
tags = {testing},
researchr = {https://researchr.org/publication/LinR82},
cites = {0},
citedby = {0},
pages = {580-586},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
publisher = {IEEE Computer Society},
}