On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection - researchr publication authors

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Xijiang Lin, Sudhakar M. Reddy, Wu-Tung Cheng. On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 132-137, IEEE Computer Society, 2016. [doi]

This author has not been identified. Look up 'Xijiang Lin' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in GoogleThis author has not been identified. Look up 'Wu-Tung Cheng' in Google

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