Xijiang Lin, Sudhakar M. Reddy, Wu-Tung Cheng. On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 132-137, IEEE Computer Society, 2016. [doi]
@inproceedings{LinRC16,
title = {On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection},
author = {Xijiang Lin and Sudhakar M. Reddy and Wu-Tung Cheng},
year = {2016},
doi = {10.1109/ATS.2016.22},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.22},
researchr = {https://researchr.org/publication/LinRC16},
cites = {0},
citedby = {0},
pages = {132-137},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}