Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski. Transistor stuck-on fault detection tests for digital CMOS circuits. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{LinRR16,
title = {Transistor stuck-on fault detection tests for digital CMOS circuits},
author = {Xijiang Lin and Sudhakar M. Reddy and Janusz Rajski},
year = {2016},
doi = {10.1109/ETS.2016.7519329},
url = {http://dx.doi.org/10.1109/ETS.2016.7519329},
researchr = {https://researchr.org/publication/LinRR16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9659-2},
}