Jianjie Lin, Markus Rickert 0001, Long Wen, Fengjunjie Pan, Alois Knoll. Knowledge-Augmented Anomaly Detection in Small Lot Production for Semantic Temporal Process Data. In 28th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2023, Sinaia, Romania, September 12-15, 2023. pages 1-8, IEEE, 2023. [doi]
@inproceedings{LinRWPK23, title = {Knowledge-Augmented Anomaly Detection in Small Lot Production for Semantic Temporal Process Data}, author = {Jianjie Lin and Markus Rickert 0001 and Long Wen and Fengjunjie Pan and Alois Knoll}, year = {2023}, doi = {10.1109/ETFA54631.2023.10275461}, url = {https://doi.org/10.1109/ETFA54631.2023.10275461}, researchr = {https://researchr.org/publication/LinRWPK23}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {28th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2023, Sinaia, Romania, September 12-15, 2023}, publisher = {IEEE}, isbn = {979-8-3503-3991-8}, }