Jianjie Lin, Markus Rickert 0001, Long Wen, Fengjunjie Pan, Alois Knoll. Knowledge-Augmented Anomaly Detection in Small Lot Production for Semantic Temporal Process Data. In 28th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2023, Sinaia, Romania, September 12-15, 2023. pages 1-8, IEEE, 2023. [doi]
Abstract is missing.